Open AccessX-ray microscopy using two phase contrast imaging techniques: two dimensional grating interferometry and speckle tracking
Author(s) -
Hongchang Wang,
Sébastien Bérujon,
I. Pape,
Kawal Sawhney
Publication year - 2013
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/463/1/012042
Subject(s) - speckle pattern , phase contrast microscopy , optics , speckle imaging , phase contrast imaging , interferometry , microscopy , contrast (vision) , grating , phase (matter) , materials science , x ray phase contrast imaging , speckle noise , tracking (education) , phase imaging , physics , psychology , quantum mechanics , pedagogy
International audienceTwo phase contrast imaging techniques, namely two dimensional grating interferometry and X-ray speckle tracking (XST), have been combined with the use of a Fresnel Zone Plate (FZP) for application to X-ray microscopy. Both techniques allows the phase shift introduced by a sample on a hard X-ray beam in two dimensions, to be recovered with a high sensitivity and low requirements on transverse and longitudinal coherence. Sub-micron phase imaging of carbon fibres was achieved using the two methods thanks to the high magnification ratio of the FZP. Advantages, drawbacks and differences between these two techniques for X-ray microscopy are discusse