Open AccessSurface-charge measurements in microgap dielectric barrier discharge using bismuth silicon oxide crystals
Author(s) -
Seiji Mukaigawa,
Hirotaka Matsuda,
H. Fue,
Rohta Takahashi,
Koichi Takaki,
Tamiya Fujiwara
Publication year - 2013
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/441/1/012012
Subject(s) - materials science , bismuth , silicon , dielectric , oxide , surface charge , optoelectronics , chemistry , metallurgy