Open AccessCoherence preservation of synchrotron beams by multilayers
Author(s) -
Ch. Morawe,
R. Barrett,
K. Friedrich,
Rafaël Klunder,
Amparo Vivo
Publication year - 2013
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/425/5/052027
Subject(s) - beamline , undulator , optics , monochromatic color , synchrotron radiation , synchrotron , coherence (philosophical gambling strategy) , synchrotron light source , materials science , substrate (aquarium) , bragg's law , beam (structure) , x ray optics , diffraction , physics , x ray , storage ring , oceanography , quantum mechanics , geology
International audienceThis work discusses the spatial coherence preservation and the uniformity of a synchrotron beam reflected from multilayer based x-ray optics. Experiments were carried out on the ESRF undulator beamline ID06 using direct imaging and the Talbot technique. Several W/B4C multilayers with differing d-spacings were studied with monochromatic light at various photon energies. To understand the respective influence of the underlying substrate and the multilayer coatings, measurements were made under total reflection, at different Bragg peaks, and on the bare substrates. In addition, samples with different substrate quality were compared. In the present study, both the degree of spatial coherence preservation and the visibility of characteristic line structures in the x-ray beam seem to be given by the properties of the underlying substrat