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Theoretical study on electron impact excitation and recombination of highly charged ions
Author(s) -
Chenglin Dong,
Jun Jiang,
D H Zhang,
Y L Shi,
Zhongwen Wu,
Lu-You Xie,
Xiaobin Ding,
Wan Jian-Jie
Publication year - 2012
Publication title -
journal of physics conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/388/1/012004
Subject(s) - excitation , recombination , excited state , atomic physics , ion , electron , electron ionization , physics , chemistry , ionization , nuclear physics , quantum mechanics , biochemistry , gene

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