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A NEGF study of the effect of surface roughness on CMOS nanotransistors
Author(s) -
Antonio Martı́nez,
A. Svizhenko,
M. P. Anantram,
John R. Barker,
A. Asenov
Publication year - 2006
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/35/1/024
Subject(s) - surface roughness , surface finish , formalism (music) , non equilibrium thermodynamics , discretization , condensed matter physics , materials science , poisson's equation , mechanics , physics , mathematical analysis , mathematics , quantum mechanics , composite material , art , musical , visual arts

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