A NEGF study of the effect of surface roughness on CMOS nanotransistors | Zendy

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A NEGF study of the effect of surface roughness on CMOS nanotransistors

Author(s) -

Antonio Martı́nez,

A. Svizhenko,

M. P. Anantram,

John R. Barker,

A. Asenov

Publication year - 2006

Publication title -

journal of physics. conference series

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.21

H-Index - 85

eISSN - 1742-6596

pISSN - 1742-6588

DOI - 10.1088/1742-6596/35/1/024

Subject(s) - surface roughness , surface finish , formalism (music) , non equilibrium thermodynamics , discretization , condensed matter physics , materials science , poisson's equation , mechanics , physics , mathematical analysis , mathematics , quantum mechanics , composite material , art , musical , visual arts

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