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Superiority of sapphire over silicon test masses regarding thermal noise and thermal lensing for laser interferometers with transmissive optics
Author(s) -
J. Degallaix,
C. Zhao,
Li Juf,
David Blair
Publication year - 2006
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/32/1/062
Subject(s) - optics , materials science , sapphire , silicon , noise (video) , relative intensity noise , shot noise , astronomical interferometer , optoelectronics , absorption (acoustics) , silicon on sapphire , laser , silicon on insulator , physics , semiconductor laser theory , interferometry , detector , artificial intelligence , computer science , image (mathematics)

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