
Kinetics of phase transitions in vitreous chalcogenide semiconductors AsxSe100m-x-yBiyas studied by the differential thermal analysis and exoelectron emission methods
Author(s) -
Czesław Górecki,
Tadeusz Görecki
Publication year - 2011
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/289/1/012021
Subject(s) - exoelectron emission , differential thermal analysis , chalcogenide , kinetics , analytical chemistry (journal) , activation energy , materials science , thermal stability , surface layer , semiconductor , thermal analysis , volume (thermodynamics) , exothermic reaction , phase (matter) , mineralogy , thermal , chemistry , layer (electronics) , thermodynamics , optics , metallurgy , nanotechnology , electron , optoelectronics , physics , chromatography , quantum mechanics , diffraction , organic chemistry