
Photoacoustic thermal conductivity determination of layered structures PS-Si: piezoelectric detection
Author(s) -
С. А. Алексеев,
D. A. Andrusenko,
R. M. Burbelo,
Mykola Isaiev,
Andrey Kuzmich
Publication year - 2011
Publication title -
journal of physics. conference series
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/278/1/012003
Subject(s) - materials science , thermal diffusivity , porous silicon , wafer , thermal conductivity , silicon , piezoelectricity , porosity , composite material , layer (electronics) , photoacoustic effect , optoelectronics , optics , photoacoustic imaging in biomedicine , quantum mechanics , physics