
Characterisation of an Ar-H2-O2ICP by OES: Measurement of the atomic concentrations of H and O
Author(s) -
Jochen Altenberend,
M. Majchrzak,
Yves Delannoy,
G. Chichignoud
Publication year - 2011
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/275/1/012001
Subject(s) - argon , hydrogen , inductively coupled plasma , emissivity , analytical chemistry (journal) , plasma , excitation temperature , spectral line , chemistry , atomic oxygen , atomic physics , inductively coupled plasma atomic emission spectroscopy , oxygen , doppler broadening , atomic emission spectroscopy , silicon , emission spectrum , optics , physics , organic chemistry , chromatography , quantum mechanics , astronomy