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Defects in UV-vis-NIR reflectance spectra as method for forgery detections in writing documents
Author(s) -
Fabrizia Somma,
P. Aloe,
Giuseppe Schirripa Spagnolo
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/249/1/012060
Subject(s) - reflectivity , inkwell , legitimacy , computer science , field (mathematics) , domain (mathematical analysis) , materials science , remote sensing , optics , physics , law , political science , geology , mathematics , politics , speech recognition , mathematical analysis , pure mathematics
Documents have taken up a very important place in our society. Frauds committed in connection with documents are not at all uncommon, and, in fact, represent a very large domain of the forensic science called “questioned documents”. In the field of forensic examination of questioned documents, the legitimacy of an ink entry is often an essential question. A common type of forgery consists in materially altering an existing writing or adding a new writing. These changes can be characterized by means of optical spectroscopy. The aim of this work is to perform the UV-vis-NIR reflectance spectrophotometry to analyze a range of blue and black commercial ballpoint pens, in order to investigate the discriminating abilities of the different inks found on the same document

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