Open AccessComparison of multilayered nanowire imaging by SEM and Helium Ion Microscopy
Author(s) -
Beverley J. Inkson,
X Liu,
Yong Peng,
Mark A. Jepson,
Cornelia Rodenburg
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/241/1/012080
Subject(s) - nanowire , materials science , scanning electron microscope , microscopy , helium , field ion microscope , nanotechnology , ion , optics , chemistry , composite material , physics , atomic physics , organic chemistry