Open AccessA novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation
Author(s) -
Alexander Aryshev,
Stewart Boogert,
D. F. Howell,
P. Karataev,
N. Terunuma,
J. Urakawa
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/236/1/012008
Subject(s) - transition radiation , optics , electron , cathode ray , radiation , charged particle , transverse plane , beam (structure) , resolution (logic) , dielectric , physics , materials science , optoelectronics , nuclear physics , computer science , ion , structural engineering , quantum mechanics , artificial intelligence , engineering
Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed © 2010 IOP Publishing Ltd