Open AccessA Real-Time Automated Defect Classification System Based on Two-Step Convolutional Neural Network
Author(s) -
Sen Wang,
Shijia Yan,
Qiang Shen,
Cong Luo,
Lei Li,
Juan Ai,
Shenglan Ding,
Qing Xia,
Zhi Li,
Qilin Chen,
Shilin Li,
Hongwei Dai
Publication year - 2022
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2337/1/012006
Subject(s) - convolutional neural network , computer science , artificial intelligence , process (computing) , feature (linguistics) , pattern recognition (psychology) , wafer , contextual image classification , artificial neural network , deep learning , image (mathematics) , machine learning , engineering , philosophy , linguistics , electrical engineering , operating system