Open AccessA Study on Parallel Test Approach for the Flash Burn-in Experiment in Laboratory
Author(s) -
Biao Wang,
Hao Li,
Zijie Zhang
Publication year - 2022
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2264/1/012032
Subject(s) - test (biology) , flash (photography) , burn in , computer science , field programmable gate array , test method , computer hardware , reliability engineering , embedded system , engineering , simulation , mathematics , art , paleontology , statistics , visual arts , biology