Open AccessExciton-polariton dispersion in an A III B V total internal reflection planar waveguide with a quantum well
Author(s) -
Victor N. Mitryakhin,
P. Yu. Shapochkin,
Maksim S. Lozhkin,
Yu. P. Efimov,
Sergey Eliseev,
Yu. V. Kapitonov
Publication year - 2022
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2227/1/012010
Subject(s) - polariton , total internal reflection , planar , waveguide , dispersion (optics) , optics , quantum well , reflection (computer programming) , exciton , materials science , grating , semiconductor , optoelectronics , coupling (piping) , dielectric , physics , laser , condensed matter physics , computer graphics (images) , computer science , metallurgy , programming language
In this work we propose means to determine the dispersion of light in a semiconductor total internal reflection (TIR) planar waveguide featuring dielectric response of excitons from a quantum well (QW). The given theoretical apparatus is then used to reproduce the data experimentally acquired when probing the AlGaAs-based waveguide (with a GaAs QW in its waveguiding layer) with a continuous laser through a coupling grating and then gathering the light transmitted through the waveguiding layer.