Open AccessDesign and Application of a Transient Response Test Module
Author(s) -
Fang Wang,
Hesong Wu,
Bin Wang
Publication year - 2022
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2213/1/012011
Subject(s) - transient (computer programming) , transient response , computer science , test (biology) , reliability engineering , engineering , electrical engineering , operating system , paleontology , biology
The transient characteristics of low dropout regulator (LDO) are very important to the final imaging effect of mobile phone camera. This design is a test module developed for the transient response test of LDO products. This module is cost-efficient and time-efficient and function-trimmed, and the test results are quantifiable and repeatable which satisfy the needs of transient response test of LDO products. This article describes the test principle of transient response and the hardware design and implementation of transient response module. The validity of such modules shown by the result of a real test of a 1A LDO. More importantly, it points out the details that should be paid attention to in the test process. It provides a reference for IC design engineers and application test engineers, and one can easily build modules according to this paper for practical testing.