
A comparative study of the effect of ions of different atomic masses on the magnetoresistive properties of Co90Fe10/Cu superlattices
Author(s) -
Н. В. Гущина,
К. В. Шаломов,
В. В. Овчинников,
Н. С. Банникова,
Р. С. Заворницын,
М. А. Milyaev
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2144/1/012028
Subject(s) - superlattice , magnetoresistance , ion , substrate (aquarium) , silicon , irradiation , atom (system on chip) , materials science , analytical chemistry (journal) , atom probe , chemistry , atomic physics , crystallography , physics , metallurgy , magnetic field , optoelectronics , microstructure , oceanography , organic chemistry , chromatography , quantum mechanics , nuclear physics , computer science , embedded system , geology
The effect of inert gas ions with different atomic masses (Ar + , Xe + ) on the magnetoresistance of Co 90 Fe 10 /Cu superlattices deposited on a silicon substrate has been investigated by comparison. The Ar + ion irradiation has been found to decrease the magnetoresistance more significantly than Xe + ion irradiation, which seems to be due to a larger average projective range for Ar + (R p = 5–6 nm) than that for Xe + (R p = 3.3–4.3 nm) and, accordingly, a greater depth of the atom mixing zone (∽(2–3)×R p ) when ions move from the top layers of the superlattice toward the substrate.