
Evaluation of thermal parameters of layers and interfaces in silicon-on-diamond structures by a photothermal method
Author(s) -
A. Yu. Klokov,
D. F. Aminev,
A. V. Sharkov,
T. I. Galkina,
Victor Ralchenko
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/214/1/012108
Subject(s) - diamond , materials science , thermal conductivity , interfacial thermal resistance , silicon , thermal resistance , photothermal therapy , substrate (aquarium) , heterojunction , layer (electronics) , material properties of diamond , polycrystalline diamond , composite material , thermal , optoelectronics , nanotechnology , thermodynamics , oceanography , physics , geology