
Physical features of control of the surface relief of precision products
Author(s) -
Михаил Шалыгин,
А. П. Суслов,
Lydia Desyatskaya
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2131/5/052022
Subject(s) - polishing , filter (signal processing) , calibration , distortion (music) , grinding , computer science , range (aeronautics) , wiener filter , process (computing) , accuracy and precision , surface (topology) , kinematics , algorithm , mechanical engineering , mathematics , materials science , engineering , computer vision , physics , statistics , amplifier , computer network , geometry , bandwidth (computing) , classical mechanics , composite material , operating system
The quality precision measurements of the product manufacturing or their surface treatment are considered. The importance of high-precision measurements at high speed, which does not require delivering the product to a special control laboratory, is shown. A precision laser measuring system is developed and manufactured, its kinematic diagram is presented and the calibration process is described. The verification of the measuring process results is given on the example of the parts obtained by polishing and grinding the surface. The dependence of the measurement error calculation is given, it is shown that the error of the measuring system is within acceptable limits. The presented measuring system has the capabilities of processing measurement results and constructing 3D images. Thus, the possibility of obtaining the surface topography parameters in accordance with ISO 25178-1, 25178-2 is shown. The methods of the surface treatment and filtering are used to improve the result accuracy of measuring the manufactured part quality, among which the elimination of the average slope, median filtering, and Wiener filter are described. It is shown that the highest accuracy of measurement results in the nanometre range with minimizing distortion losses is possible using the Wiener filter.