Open AccessThe Influence of Noise in the Super-Resolution Reconstruction of Structured Illumination Microscopy
Author(s) -
Jinxi Bai,
Z.B. Shi,
Hua Ma,
Lijia Liu,
Lin Zhang
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2112/1/012012
Subject(s) - noise (video) , resolution (logic) , distortion (music) , computer science , optics , image resolution , process (computing) , computer vision , artificial intelligence , physics , image (mathematics) , telecommunications , amplifier , bandwidth (computing) , operating system
As one of the mainstream super-resolution imaging technologies, structured illumination microscopy (SIM) is popular for its fast imaging speed and simple optical path structure. Spectrum separation is a key step in the reconstruction of super-resolution images. However, in the process of imaging, the unavoidable noise will seriously affect the accuracy of frequency spectrum separation. This paper carries out a simulation study on the influence of noise in the process of frequency spectrum separation. The results show that although noise can cause distortion of low-frequency information in frequency spectrum separation results, it has little influence on high-frequency information. Therefore, a super-resolution image reconstruction method is proposed to effectively suppress the influence of noise. Both simulation and experimental results are shown the method can suppress the influence of noise without losing the details of super-resolution.