Open AccessDevelopment of the Line Protection Measurement and Control Device based on Domestic MCU
Author(s) -
Chengxuan Zhao,
Yuantao Wang,
Chuankun Ni,
Chen Hu,
Yunlong Xu,
Wei Ma,
Yaxin Su
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2108/1/012017
Subject(s) - microcontroller , sampling (signal processing) , oversampling , linearity , computer science , reliability (semiconductor) , dual (grammatical number) , data acquisition , chip , embedded system , computer hardware , engineering , electronic engineering , telecommunications , cmos , art , power (physics) , physics , literature , quantum mechanics , detector , operating system
In this paper, the dual MCU hardware architecture of protection measurement and control device was presented by analyzing the current situation of domestic MCU and chip selection. The problems existing in ADC sampling accuracy and ADC integral non-linearity were studied. The design scheme of high-precision ADC acquisition system based on dual MCU architecture was proposed, which could meet the requirements of technical specifications by using oversampling and adaptive processing of sampling nonlinear area. In terms of reliability, the EMC performance of the device was promoted by the improvement of outlet and ADC acquisition circuit.