Open AccessDesign of electrically driven single-photon source based on intra-cavity contacted microcavity with oxide-confined optical apertures emitting at 1.3 μm
Author(s) -
S. A. Blokhin,
M. A. Bobrov,
N. A. Maleev,
A. A. Blokhin,
A. P. Vasyl’ev,
A. G. Kuzmenkov,
V. A. Shchukin,
N. N. Ledentsov,
Stephan Reitzenstein,
V. M. Ustinov
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2103/1/012181
Subject(s) - optics , aperture (computer memory) , materials science , optoelectronics , photon , optical microcavity , purcell effect , dielectric , electric field , semiconductor , numerical aperture , physics , spontaneous emission , laser , wavelength , quantum mechanics , acoustics
We propose a hybrid microcavity design of a 1.3 μm range electrically driven single-photon source (SPS) consisting of two high-contrast dielectric distributed Bragg reflectors which surround a 3λ-thick semiconductor cavity with two intra-cavity contact layers and four 40-nm-thick oxide-confined apertures. According to 3D finite-difference time-domain modelling, the overall photon-extraction efficiency of ~74% and the Purcell factor of ~13 can be obtained by properly adjusting the position of oxide-confined apertures relative to the electric field of the fundamental optical mode. The studied SPS design also demonstrates a coupling efficiency of up to 13% within numerical aperture 0.12 in contrast to ~5% reached for a conventional semiconductor micropillar.