Open AccessSpectral Fourier-microscopy of the periodic structures based on Ge2Sb2Te5
Author(s) -
Alexander I. Solomonov,
S. I. Pavlov,
P I Lazarenko,
Vadim Kovalyuk,
Alexander Golikov,
A. Prokhodtsov,
Gregory Goltsman,
S. A. Kozyukhin,
Sergey A. Dyakov,
N. A. Gippius,
S. G. Tikhodeev,
А. Б. Певцов
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2103/1/012173
Subject(s) - fourier transform , optics , dispersion (optics) , reflection (computer programming) , materials science , diffraction , resolution (logic) , diffraction grating , microscopy , spectral line , fourier analysis , amorphous solid , molecular physics , physics , crystallography , chemistry , quantum mechanics , astronomy , artificial intelligence , computer science , programming language
The method of spectral Fourier microscopy was used to study the reflection spectra with an angular resolution of submicron periodic gratings based on amorphous and crystalline Ge 2 Sb 2 Te 5 . The form of the dispersion curves of quasi-waveguide modes in the structures under study was established. The experimental data were compared with the calculations of dispersion curves in synthesized diffraction gratings. Reasonable agreement between theoretical and experimental data was obtained.