Open Access144Ce - 144Pr spectrum measurement with 4π semiconductor β-spectrometer
Author(s) -
I. E. Alekseev,
С. В. Бахланов,
A. Derbin,
I. Drachnev,
I. M. Kotina,
I. Lomskaya,
M S Mikulich,
V. Muratova,
N. V. Niyazova,
D. Semenov,
Maxim V. Trushin,
E. Unzhakov
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2103/1/012141
Subject(s) - spectrometer , semiconductor detector , physics , scintillator , detector , electron , semiconductor , neutrino , energy (signal processing) , nuclear physics , electron spectrometer , spectral line , particle detector , atomic physics , optics , optoelectronics , cathode ray , quantum mechanics , astronomy
Precision β-spectra measurement always had a great importance in some fundamental physics problems including neutrino physics. Magnetic and electrostatic spectrometers have high resolution, but at the same time usage of such kinds of equipment involves the size and cost issues. Since electron mean free path at the energy of 3 MeV (which is basically the maximum energy of a β-transition for the long-lived nuclei) does not exceed 2 g/crn 2 , electron registration could be effectively performed with the solid state scintillators and semiconductors. A strong probability of backscattering from detector surface is present in case of semiconductor detectors and is dependent upon the detector material. Such problem can be solved with 4π geometry detector development, which fully covers the radioactive source and is able to register the backscattered electrons. In this work we present the newly developed technology of 4π geometry β-spectrometer based on two semiconductor detectors. This spectrometer was used for measurement of the 144 Ce - 144 Pr spectrum, that is the perspective anti-neutrino source due to endpoint energy at 3 MeV and can be used for the sterile neutrino search experiments. The form-factor parameters that were obtained are: C(W ) = 1 + (-0.02877 ± 0.00028)W + (-0.11722 ± 0.00297)W -1 . The measurement accuracy was sufficiently enhanced with respect to the previous results.