Current status of 50-picosecond resolved x-ray diffraction at Photon Factory Advanced Ring (PF-AR)
Author(s) -
Shinichi Adachi,
Shunsuke Nozawa,
Ryoko Tazaki,
Junichi Takahashi,
Jiro Itatani,
Masahiro Daimon,
Takeharu Mori,
Hiroshi Sawa,
Hiroshi Kawata,
Tokushi Sato,
Ayana Tomita,
Matthieu Chollet,
Laurent Guérin,
Éric Collet,
H. Cailleau,
Shinya Koshihara
Publication year - 2005
Publication title -
journal of physics conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/21/1/016
Subject(s) - femtosecond , picosecond , laser , diffractometer , diffraction , storage ring , synchrotron radiation , optics , synchrotron , beamline , advanced photon source , materials science , x ray , optoelectronics , physics , beam (structure) , scanning electron microscope
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