Open AccessA method of determining the parameters in systems with serialized Current-Voltage characteristics
Author(s) -
R.O. Ocaya,
F. Yakuphanoğlu
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2090/1/012077
Subject(s) - symmetry (geometry) , diode , series (stratigraphy) , experimental data , voltage , current (fluid) , computer science , physics , algorithm , electronic engineering , mathematics , engineering , statistics , quantum mechanics , paleontology , geometry , thermodynamics , biology
We propose a method of determining the parameters of systems with serialized characteristics, which may suggest the existence of symmetry in the system. The method is demonstrated in extracting the parameters of a metal-semiconductor in the presence of significant series resistance, which is itself important but limits the accuracy of the existing methods in the determination of the other calculated parameters such as barrier height and ideality factor. We show the steps involved in establishing whether symmetry exists, and show that some functional interrelations between the parameters and the independent variables can readily be established. We use actual measurement data from an experimental diode and show that the results outperform the popular Cheung-Cheung approach. This general approach, therefore, represents a significant advancement in the analysis of serialized empirical data.