Open AccessImproved accuracy in nano beam electron diffraction
Author(s) -
Armand Béché,
L. Clément,
Jean-Luc Rouvière
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/209/1/012063
Subject(s) - materials science , diffraction , optics , electron diffraction , condenser (optics) , beam (structure) , cathode ray , silicon , electron , optoelectronics , physics , light source , quantum mechanics