
16th International Conference on Microscopy of Semiconducting Materials
Author(s) -
T. Walther,
Pete Nellist,
J. L. Hutchison,
A. G. Cullis
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/209/1/011001
Subject(s) - microscopy , materials science , nanotechnology , physics , optics