Open AccessElectronic Current Transformer Defects Statistical Analysis of Intelligent Substation
Author(s) -
Bin Liu,
Xiaodong Xie,
Junjun Xiong,
Xiaopin Deng,
Hua Huang
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2087/1/012088
Subject(s) - reliability engineering , reliability (semiconductor) , transformer , current transformer , statistical analysis , statistical process control , engineering , electrical engineering , computer science , process (computing) , voltage , mathematics , statistics , power (physics) , physics , quantum mechanics , operating system
In order to master operation status of the electronic current transformer(ECT), application investigation and defects statistical analysis were conducted on ECT of 110(66)kV~1000kV applied in smart substation of the State Grid Corporation of China(SGCC). The defect location, defect cause and defect type of ECT with different principles are analyzed. The results indicate that the defects of ECT are mainly concentrated in the acquisition unit, the defect rate is closely related to the reliability of electronic components, the technical level, production process and quality control of the manufacturer. In view of the typical defect analysis, the corresponding solution measures are put forward to provide reference for the subsequent research and application of ECT.