Open AccessSimulating the spectral characteristics of reflection in planar porous structures with antireflection coatings ZnS/DyF3
Author(s) -
Daria Shishkina,
I A Shishkin,
P Tishin
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2086/1/012168
Subject(s) - porous silicon , planar , porosity , materials science , reflection (computer programming) , silicon , matrix (chemical analysis) , reflectivity , porous medium , variable (mathematics) , optics , optoelectronics , composite material , physics , computer science , mathematics , mathematical analysis , computer graphics (images) , programming language
This paper presents the results of modeling a planar multilayer structure with layers of porous silicon, ZnS and DyF 3 coatings by the optical matrix method. It was shown that the optical matrix method, taking into account the model of porous silicon with a variable band gap, which takes into account the porosity gradient, allows us to approximate the course of the curve of the real experiment