Open AccessScanning ion-conductance microscope with modulation of the sample position along the Z-coordinate and separate Z-axial and lateral (X, Y) scanning
Author(s) -
M. V. Zhukov,
S. Yu. Lukashenko,
I. D. Sapozhnikov,
M. L. Felshtyn,
О. М. Горбенко,
A. O. Golubok
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2086/1/012074
Subject(s) - materials science , pipette , reproducibility , microscope , conductance , substrate (aquarium) , position (finance) , scanning probe microscopy , resolution (logic) , scanning ion conductance microscopy , optics , analytical chemistry (journal) , scanning electron microscope , chemistry , nanotechnology , mathematics , scanning confocal electron microscopy , physics , chromatography , composite material , computer science , oceanography , finance , artificial intelligence , economics , geology , combinatorics
Scanning ion-conductance microscope with independent piezoscanners in the lateral scanning plane XY and Z axis was designed and tested. For precise, fast and safe approach of the nanopipette to the sample surface, a coarse approach system based on a piezoinertial mover was used. Measurements of test periodic polymer structures were carried out using nanopipettes with an inner pipette diameter of about 100-150 nm. The optimal geometric parameters of the nanopipette were found and the resolution of the method was estimated. To increase the stability and reproducibility of SICM images, the Z-modulation of the position of the substrate with the sample was realized using a bimorph piezomembrane.