Open AccessNanoobject mass measurement using the node displacement of the second mode of the nanomechanical resonator
Author(s) -
Nikita A Solomonov,
Kristiovikova,
Iridoyan,
А. М. Можаров,
V. A. Shkoldin,
Yury Berdnikov,
I. S. Mukhin
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2086/1/012026
Subject(s) - cantilever , node (physics) , resonator , materials science , scanning electron microscope , weighting , displacement (psychology) , vibration , nanoscopic scale , mode (computer interface) , nanotechnology , tungsten , tracing , optics , acoustics , optoelectronics , physics , computer science , composite material , psychology , metallurgy , psychotherapist , operating system
This work suggests a new approach to weighting the nanoscale objects placed at the tip of cantilever vibrating inside the camera of scanning electron microscope. In contrast to traditional approach to mass determination, we suggest tracing the shift of the node of the second vibration mode as an alternative to frequency shift measurement. We demonstrate the applicability of our approach to carbon nanowhisker cantilevers grown on tungsten needles by focused electron beam induced deposition. We compare experimentally the performance of the suggested approach with the traditional frequency shift-based method.