Open AccessInstabilities of electrical properties of He-induced W “fuzz” within the pre-breakdown and breakdown regimes
Author(s) -
Yu. A. Zemskov,
Yu. I. Mamontov,
I. V. Uimanov,
Н. М. Зубарев,
Andrey V. Kaziev,
M. M. Kharkov,
S. A. Barengolts
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2064/1/012004
Subject(s) - anode , cathode , materials science , breakdown voltage , diode , voltage , common emitter , radius , optoelectronics , electrical breakdown , current (fluid) , electrical engineering , electrode , chemistry , dielectric , engineering , computer security , computer science
The investigation of the He-induced W “fuzz” electrical properties was carried out. For the research, an automated experimental setup was designed. The setup was based on a vacuum chamber operated under high vacuum conditions (~ 10 −7 Pa). The vacuum diode under investigation comprised of a flat W “fuzz” cathode with an area of about 1 cm 2 and a 2 mm radius cylindrical copper anode with a hemisphere tip. The cathode-anode distance was about 100 μm. The voltage applied was up to 10 kV. A DAC/ADC module controlled an HV power supply and automatically registered currents and voltages in the circuit. The effect of a spontaneous change in the emissive ability of the investigated surface area was observed. These changes can vary significantly in magnitude. Large-scale changes can lead to a permanent increase in the emissive ability of a specific area or to a breakdown of the gap. Small changes, as a rule, are reversible, have a stepped nature, and make it difficult to record and interpret the current-voltage characteristics of the field emitter.