Open AccessPossibility of applying X-ray methods to control the surface quality of a shaft line after finishing
Author(s) -
E N Syusyuka
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2061/1/012022
Subject(s) - residual stress , diffractometer , diffraction , materials science , austenite , scattering , hardening (computing) , surface layer , residual , surface finish , x ray crystallography , grinding , composite material , optics , metallurgy , layer (electronics) , microstructure , computer science , physics , scanning electron microscope , algorithm
The purpose of the paper is to analyze the application limits of X-ray methods of non-destructive testing of loaded parts; to compare the results of microstresses and deformations of the details’ surface layer by methods and by the method of X-ray diffraction analysis for various modes of processing the detail surface layer. The studies are carried out on a “Dron” diffractometer. The technique and algorithm of X-ray structural studies, namely, “sin2v|/”-method are represented. Residual macro σ φ and micro stresses, as well as the sizes of the areas of coherent scattering (D) on the samples surfaces processed in various modes, and their distribution in the near-surface layer are designated. Phase analysis is conducted and the presence of residual austenite. The research object is the operating surface of the 46-19-186 gear tooth after various treatments: after HFC hardening; after HFC hardening, grinding and blasting in depressions; after HFC hardening and fine-finish cutting. The X-ray structural analysis (XRD) technique is presented to determine the residual macro-σ φ and microstresses, the sizes of the coherent scattering regions (D) on the surfaces of the samples processed in different modes. The outcomes of X-ray structural analysis are compared with the outcomes of metallographic studiesmaking. It was determined that the stress relaxation during the manufacture of the sample is no more than 10%, and the total instrumental error of the X-ray spectral analysis method is about 1%.