Open AccessEstimating the uncertainty of measurements of thermal conductivity of thin films of thermoelectrics with the 3-omega method
Author(s) -
E. S. Makarova,
Anna V. Novotelnova
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2057/1/012108
Subject(s) - bismuth , resistive touchscreen , thermal conductivity , materials science , thermoelectric materials , omega , thermoelectric effect , thin film , thermal conductivity measurement , silicon , dielectric , conductivity , optoelectronics , layer (electronics) , composite material , thermodynamics , nanotechnology , electrical engineering , physics , engineering , quantum mechanics , metallurgy
Using the method of computer simulation, the uncertainty of measurements of the thermal conductivity of silicon, which is often used as substrates, and also thin films based on bismuth, is estimated. The influence of the application of an additional dielectric layer between the thermoelectric film and the resistive heater on the measurement results is shown.