Open AccessAutomation of procedure for diagnostics of thin film electroluminescent indicators’ structure
Author(s) -
O. V. Maksimova,
П. В. Николаев,
S V Moiseenko,
V. V. Belyaev
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2056/1/012056
Subject(s) - automation , electroluminescence , software , computer science , process (computing) , task (project management) , electroluminescent display , process engineering , reliability engineering , systems engineering , engineering , materials science , mechanical engineering , nanotechnology , layer (electronics) , programming language , operating system
Problems of measurement automation for creating a testing system are considered. This system accelerates the process of parameters controlling in the production and development of new samples of indicator (display) technology. The main parameters of the indicators are defined, the tasks of automation of measuring processes are indicated, the hardware and software structure of the system is developed. The main features of an integrated approach to solve the problems of automating the process of testing the structures of thin-film electroluminescent indicators were proposed, the parameters of thin-film electroluminescent indicators were considered as the basis for forming the composition of an automated testing complex, and the automation of processing the experimental results at the software level was described. The ideas outlined in this article make it possible to formulate a technical task for the development of a complex for automated measurement of the parameters of thin-film electroluminescent elements, as well as its components and software.