Open AccessMethods and facilities of the automated control for thin film indicators
Author(s) -
O. V. Maksimova,
П. В. Николаев,
S V Moiseenko,
V. V. Belyaev
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2056/1/012055
Subject(s) - electroluminescence , brightness , automation , realization (probability) , thin film , voltage , software , computer science , process (computing) , electroluminescent display , basis (linear algebra) , materials science , electronic engineering , optoelectronics , electrical engineering , engineering , optics , nanotechnology , mechanical engineering , physics , mathematics , statistics , layer (electronics) , geometry , programming language , operating system
The algorithms, methods for measuring the structure parameters of thin-film electroluminescent indicators are studied. The algorithm for determining threshold voltage and plotting current – brightness characteristics was created. Realization of this algorithm accelerates process of monitoring of parameters by production known and development of new exemplars of indicator technique on the basis of thin-film electroluminescent indicators. The main aspects of a comprehensive approach to problem solving of automation of process of measurement of values of parameters of structures of thin-film electroluminescent indicators were designated, features of functioning of thin-film electroluminescent indicators as a basis of formation of structure of the device of the automated testing are considered, automation of processing of results of an experiment at the level of the software is described. Key parameters of indicators are determined, problems of automation of measuring processes are formulated, and the algorithm of determination of the threshold voltage and creation of voltage-brightness characteristic of the thin-film electroluminescent indicators in the automated mode is developed. The ideas explained in this article allow formulating the requirement specification on development of the device of the automated measurement of parameters of thin-film electroluminescent elements and also its constituents and the software.