Open AccessComputational experiment of the thin-film electroluminescent display devices applicability in aviation
Author(s) -
D.A. Evsevichev,
O. V. Maksimova,
M.K. Samokhvalov
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2056/1/012054
Subject(s) - electroluminescence , avionics , reliability (semiconductor) , electroluminescent display , aviation , thin film , materials science , computer science , service life , optoelectronics , reliability engineering , engineering , aerospace engineering , nanotechnology , composite material , power (physics) , physics , layer (electronics) , quantum mechanics
The development of methods and means of testing the applicability of thin-film electroluminescent indicator devices as displays in aircraft is carried out. Thin-film electroluminescent displays are used in equipment and systems that require high image quality and reliability, as well as a long service life of the devices. The result of the performed work is the ExpAT program, which allows to carry out a computational experiment to test of the applicability of the TFEL indicator devices in aeronautical engineering. As a result of the computational experiment, variants of structures of thin-film emitting structures that meet the operating conditions of indicators in avionics are shown.