Open AccessModeling of polygonal half–loops dislocations in silicon single crystal using X–ray diffraction topo–tomography data
Author(s) -
В. А. Григорьев,
Petr V. Konarev,
Д. А. Золотов,
А. В. Бузмаков
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2036/1/012015
Subject(s) - burgers vector , dislocation , diffraction , materials science , silicon , tomography , crystal (programming language) , x ray , crystallography , single crystal , x ray crystallography , condensed matter physics , optics , physics , computer science , optoelectronics , chemistry , composite material , programming language