Open AccessStudy on Calibration Method for Testing During Burn In equipment of integrated circuits
Author(s) -
Chongjun Sun,
Chao Ding
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2029/1/012035
Subject(s) - traceability , calibration , computer science , embedded system , field programmable gate array , software , process (computing) , integrated circuit , digital signal processing , computer hardware , electronic engineering , reliability engineering , engineering , software engineering , statistics , mathematics , programming language , operating system
In order to implement Method 1015 of GJB 548B, TDBI(Testing During Burn In) technology of integrated circuit is widely used in the aging process of core VLSI(Very Large Scale Integration) which is included of FPGA, DSP, CPU and dedicated chips. Many models of TDBI equipment at home or abroad have been come into use. It is an important task to calibrate TDBI equipment in system level and ensure the traceability of its measurement value. At present, the calibration device of TDBI equipment has been successfully finalized and put into production, which has the advantages of convenient use and high cost performance. This paper mainly introduces the calibration method for TDBI equipment of integrated circuit from the aspects of the overall architecture design, signal adaptation design and calibration software design.