Open AccessX-Ray Peak Profile Analysis of Silica by Williamson–Hall and Size-Strain Plot Methods
Author(s) -
B Hariyanto,
D A P Wardani,
N Kurniawati,
Nazopatul Patonah Har,
Noviyan Darmawan,
Irzaman Irzaman
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2019/1/012106
Subject(s) - crystallite , annealing (glass) , diffraction , materials science , quartz , analytical chemistry (journal) , x ray crystallography , lattice constant , scherrer equation , crystallography , hexagonal crystal system , condensed matter physics , mineralogy , chemistry , composite material , optics , physics , metallurgy , chromatography
Annealed silica has been prepared by various annealing temperatures at 800 °C and 1000 °C. The crystallite size and lattice strain of silica were estimated by x-ray diffraction spectra analysis using various calculation methods; Modified Scherrer, Williamson-Hall (W-H), and Size-Strain Plot. Qualitative analysis confirms that the XRD patterns were hexagonal quartz. Annealing temperature cause a change in crystal size and lattice strain and all methods showed a decrease in the value of the crystal size with increasing annealing temperature from 800 °C to 1000 °C.