Open AccessPermeability and Permittivity Measurements of Teflon in Millimeter Wave
Author(s) -
Erfan Handoko,
Mangasi Alion Marpaung,
Riser Fahdiran,
Zulkarnain Jalil,
Mudrik Alaydrus
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2019/1/012104
Subject(s) - permittivity , permeability (electromagnetism) , materials science , dielectric , extremely high frequency , millimeter , dielectric loss , relative permittivity , dielectric permittivity , composite material , electromagnetic radiation , nuclear magnetic resonance , optics , optoelectronics , physics , chemistry , biochemistry , membrane
In order to expand a new millimeter wave absorbing material over the V-band frequency range, teflon were prepared with thickness of 1.4 mm, 1.5 mm, and 1.6 mm. The variation of electromagnetic variables (complex permeability µ=µ′–jµ″ and complex permittivity ε=ε′–jε″) properties were studied over the V-band frequency range with varying sample thickness. Both dielectric loss (ε″) and magnetic loss (µ″) were leading to strong fluctuations, whereas the dielectric constant (ε′) was found to decrease and magnetic permeability (µ′) increased in the frequency range of 50–67 GHz.