Open AccessAnalysis of Lattice Constants and Error for The Hexagonal Crystal Structure of Silicon Dioxide Using The Cramer-Cohen Method
Author(s) -
N Kurniawati,
D A P Wardani,
B Hariyanto,
Nazopatul Patonah Har,
Noviyan Darmawan,
Irzaman Irzaman
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2019/1/012071
Subject(s) - hexagonal crystal system , crystal structure , lattice constant , silicon dioxide , silicon , lattice (music) , hexagonal lattice , materials science , crystal (programming language) , crystallography , chemistry , condensed matter physics , physics , optics , computer science , optoelectronics , diffraction , programming language , antiferromagnetism , acoustics , metallurgy
Has successfully analyzed the lattice constants and the error of the hexagonal crystal structure of silicon dioxide (SiO2) using the Cramer-Cohen method. The peak data for the silicon dioxide material used are secondary data from the ICDD. The Cramer-Cohen method calculations show that the lattice constants are relatively the same as the secondary data from the ICDD, with an average error analysis value of 0,001531805%. This shows that the analysis of the lattice constant and the error of the hexagonal crystal structure of silicon dioxide (SiO 2 ) using the Cramer-Cohen method is very accurate.