Open AccessComparative study of 0.1Hz very-low frequency withstand voltage test method and traditional method
Author(s) -
Dong Mei Sun,
Jinyu Gao,
Yongxin Piao,
Bo Guo,
Chengjia Qu,
Zichen Gao,
Hongxing Wang
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2005/1/012175
Subject(s) - voltage , waveform , low voltage , electrical engineering , low frequency , acoustics , test method , materials science , dielectric withstand test , very low frequency , engineering , physics , telecommunications , mathematics , statistics
The o.1Hz very-low frequency withstand voltage test method has the advantages of small equipment size and low power demand, and is used more and more in the power grid, especially in withstand voltage test. However, the effect of this voltage waveform and the traditional test waveform on the insulation assessment is still unclear. This paper compares the difference between 0.1Hz very-low frequency and DC voltage, resonance voltage and oscillating wave voltage in the withstand voltage test. Research indicates that the 0.1Hz very-low frequency withstand voltage test has good equivalence in cables with mechanical "faults", water tree defects in cables and power frequency, and relatively poor equivalence in terms of needle plate electrode insulation defects.