Open AccessThermal Emissivity Measurement with Two-temperature Method
Author(s) -
Yunbin Ying,
Qiang Li,
Surinder Kaur,
Pintu Ghosh
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2002/1/012056
Subject(s) - emissivity , infrared , thermal , thermal emission , materials science , radiative transfer , temperature measurement , low emissivity , thermal radiation , optics , sample (material) , environmental science , optoelectronics , remote sensing , nuclear engineering , physics , meteorology , thermodynamics , engineering , geology
Thermal emissivity is one of the most important indices used to evaluate thermal emission capability of an object and is essential for characterization of thermal emitters, especially in the field of infrared thermal emission engineering for various applications, including personal thermal management, radiative cooling and heat preservation, infrared stealth, and infrared encryption. However, due to the natural background thermal emissions from the ambient environment and experimental setup, conventional methods generally ignore the background emissions while keeping the temperature of the radiating sample significantly higher than the ambient temperature. Here, we introduce a simple method that enables accurate measurement of emissivity of a given sample without necessitating high temperature through elimination of background emission noise by the difference of the measured emission signals of the sample at two different temperatures.