Open AccessResearch on Calibration Technology of TEV Partial Discharge Smart Sensors
Author(s) -
Hongming Shao,
Zhiguo Tang
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1971/1/012064
Subject(s) - reliability (semiconductor) , switchgear , partial discharge , smart grid , calibration , sensitivity (control systems) , reliability engineering , computer science , signal (programming language) , embedded system , real time computing , electrical engineering , engineering , electronic engineering , power (physics) , voltage , statistics , physics , mathematics , quantum mechanics , programming language
TEV partial discharge detection is an important method to judge the insulation status of the switchgear. However, the quality of TEV smart sensors produced by different manufacturers on the market is uneven. Some TEV smart sensors that have been put into operation have deficiencies in measurement sensitivity, data stability, and long-term operational reliability. In response to these problems, this paper proposes a TEV smart sensor calibration method and builds a test platform, which is composed of program-controlled signal source, signal coupling device, protocol conversion device, host computer and corresponding integrated control software. On the basis of the existing standards such as sensitivity and linearity, the evaluation of the data stability, reliability and battery lifetime of the TEV smart sensor has been added. It provides a more comprehensive and effective implementation plan for TEV smart sensor performance verification in power grid access test.