
Enhanced charge transfer in doped nano-systems measured via electron-ion coincidence technique
Author(s) -
M. Hoener,
D Rolled,
Z. D. Pešić,
A Aguilart,
R. C. Bilodeau,
Eddie Red,
N. Berrah
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/194/2/022104
Subject(s) - atomic physics , cluster (spacecraft) , ion , ionization , electron , doping , charge (physics) , relaxation (psychology) , coincidence , materials science , chemistry , physics , nuclear physics , optoelectronics , medicine , social psychology , psychology , alternative medicine , organic chemistry , pathology , quantum mechanics , computer science , programming language