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Measurement of the electron affinity of As and the fine structure of Asusing infrared threshold photodetachment spectroscopy
Author(s) -
C. W. Walter,
N. D. Gibson,
Robert L. Field,
Ali Snedden,
Jonathan S. Shapiro,
C.M. Janczak,
Dag Hanstorp
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/194/2/022090
Subject(s) - atomic physics , spectroscopy , ion , infrared , chemistry , electron affinity (data page) , electron , photon , yield (engineering) , ground state , analytical chemistry (journal) , atom (system on chip) , infrared spectroscopy , physics , molecule , optics , nuclear physics , organic chemistry , quantum mechanics , chromatography , computer science , thermodynamics , embedded system

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