Open AccessMethods for designing electrical equipment for testing VLSI used in aviation digital information systems
Author(s) -
K. K. Smirnov,
A. V. Nazarov,
A Ulyahin
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1925/1/012073
Subject(s) - interface (matter) , integration testing , very large scale integration , process (computing) , chip , computer science , integrated circuit , digital signal processing , embedded system , system integration , automatic test equipment , computer hardware , engineering , reliability engineering , electrical engineering , software , bubble , maximum bubble pressure method , parallel computing , programming language , operating system , testability
Very-large-scale integrated circuits are widely and successfully used in the artificial intelligence systems and digital signal processing systems on board modern aircraft and space apparatuses through the implementation of complete digital systems on a chip. However, the level of integration of very-large-scale integrated circuits according to Moore’s Law continues to double every 2 years, and today the test equipment for their functional control is working to the limit of its capabilities. Since the development of interface boards (the main unit of test electrical equipment) for testing microcircuits is currently carried out manually, the timing of the release of microcircuits is unacceptably increasing. This article presents the original methods for automating the design of an interface board circuit using the information contained in the test vectors. By eliminating the human factor from the development process of this board, time is significantly reduced and design errors are eliminated.