Open AccessDesign of projection optical system for 3D defect detection on PCB
Author(s) -
Xu Cheng,
Feng Xu,
Shuang Ma
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1922/1/012005
Subject(s) - projection (relational algebra) , tilt (camera) , structured light , computer science , lens (geology) , contrast (vision) , structured light 3d scanner , optics , computer vision , artificial intelligence , engineering , physics , mechanical engineering , algorithm , scanner
According to the practical experience of PCB defect detection in semiconductor industry, a projection optical system suitable for structured light detection device is designed by using a DMD chip. In order to realize the lateral projection of structured light stripe and improve the quality of system projection, the design of tilt back group of projection lens is adopted and the projection size is 57×32mm.The simulation results show that the illumination uniformity of the projection system on the measured surface is more than 85%, the fringe contrast is larger than 0.5, and the maximum height of the measuring device is 5mm, which provides a guarantee for practical application of structured light fringe for 3D defect detection on PCB.